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Nanoscale interaction layer at the interface between Al films and SiO 2 substrates of Al/AlO x /Al Josephson tunnel junctions
Zeng, L. J., Greibe, T., Nik, S., Wilson, C. M., Delsing, P., Olsson, E.Volume:
113
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4801798
Date:
April, 2013
File:
PDF, 1.03 MB
2013