Functional Fault Equivalence and Diagnostic Test Generation...

Journal of Electronic Testing 2005 / 10 Vol. 21; Iss. 5

Functional Fault Equivalence and Diagnostic Test Generation in Combinational Logic Circuits Using Conventional ATPG

Andreas Veneris, Robert Chang, Magdy S. Abadir, Sep Seyedi
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Volume:
21
Language:
english
Pages:
8
DOI:
10.1007/s10836-005-1543-z
Date:
October, 2005
File:
PDF, 861 KB
english, 2005
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