![](/img/cover-not-exists.png)
Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test
Simone Borri, Magali Hage-Hassan, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud VirazelVolume:
21
Language:
english
Pages:
11
DOI:
10.1007/s10836-005-6146-1
Date:
April, 2005
File:
PDF, 497 KB
english, 2005