MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs
Sunghoon Chun, Yongjoon Kim, Sungho KangVolume:
23
Language:
english
Pages:
6
DOI:
10.1007/s10836-006-0630-0
Date:
August, 2007
File:
PDF, 299 KB
english, 2007