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Structural Fault Modeling and Fault Detection Through Neyman–Pearson Decision Criteria for Analog Integrated Circuits
Amir Zjajo, Jose Pineda de Gyvez, Guido GronthoudVolume:
22
Language:
english
Pages:
11
DOI:
10.1007/s10836-006-9499-1
Date:
December, 2006
File:
PDF, 439 KB
english, 2006