Isolation of Failing Scan Cells through Convolutional Test...

Journal of Electronic Testing 2007 / 02 Vol. 23; Iss. 1

Isolation of Failing Scan Cells through Convolutional Test Response Compaction

Grzegorz Mrugalski, Janusz Rajski, Chen Wang, Artur Pogiel, Jerzy Tyszer
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Volume:
23
Language:
english
Pages:
11
DOI:
10.1007/s10836-006-9524-4
Date:
February, 2007
File:
PDF, 315 KB
english, 2007
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