Low Capture Switching Activity Test Generation for Reducing...

Journal of Electronic Testing 2008 / 08 Vol. 24; Iss. 4

Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing

Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita
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Volume:
24
Language:
english
Pages:
13
DOI:
10.1007/s10836-007-5033-3
Date:
August, 2008
File:
PDF, 339 KB
english, 2008
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