Scan Shift Power Reduction by Freezing Power Sensitive Scan...

Journal of Electronic Testing 2008 / 08 Vol. 24; Iss. 4

Scan Shift Power Reduction by Freezing Power Sensitive Scan Cells

Xijiang Lin, Yu Huang
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Volume:
24
Language:
english
Pages:
8
DOI:
10.1007/s10836-007-5048-9
Date:
August, 2008
File:
PDF, 205 KB
english, 2008
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