Bandwidth Analysis of Functional Interconnects Used as Test...

Journal of Electronic Testing 2010 / 08 Vol. 26; Iss. 4

Bandwidth Analysis of Functional Interconnects Used as Test Access Mechanism

Ardy van den Berg, Pengwei Ren, Erik Jan Marinissen, Georgi Gaydadjiev, Kees Goossens
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Volume:
26
Language:
english
Pages:
12
DOI:
10.1007/s10836-010-5163-x
Date:
August, 2010
File:
PDF, 617 KB
english, 2010
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