Reliability Limits of TMR Implemented in a SRAM-based FPGA: Heavy Ion Measures vs. Fault Injection Predictions
Gilles Foucard, Paul Peronnard, Raoul VelazcoVolume:
27
Language:
english
Pages:
7
DOI:
10.1007/s10836-011-5245-4
Date:
October, 2011
File:
PDF, 280 KB
english, 2011