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Symmetry Measure for Memory Test and Its Application in BIST Optimization
Gurgen Harutyunyan, Aram Hakhumyan, Samvel Shoukourian, Valery A. Vardanian, Yervant ZorianVolume:
27
Language:
english
Pages:
14
DOI:
10.1007/s10836-011-5251-6
Date:
December, 2011
File:
PDF, 378 KB
english, 2011