Computing the Detection Probability for Small Delay Defects...

Journal of Electronic Testing 2011 / 12 Vol. 27; Iss. 6

Computing the Detection Probability for Small Delay Defects of Nanometer ICs

José L. García-Gervacio, Victor Champac
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Volume:
27
Language:
english
Pages:
12
DOI:
10.1007/s10836-011-5256-1
Date:
December, 2011
File:
PDF, 562 KB
english, 2011
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