An Efficient Compatibility-Based Test Data Compression and...

Journal of Electronic Testing 2011 / 12 Vol. 27; Iss. 6

An Efficient Compatibility-Based Test Data Compression and Its Decoder Architecture

Min-yong Wan, Yong Ding, Yun Pan, Xiao-lang Yan
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Volume:
27
Language:
english
Pages:
10
DOI:
10.1007/s10836-011-5258-z
Date:
December, 2011
File:
PDF, 258 KB
english, 2011
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