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Transmission electron microscopy studies of the bonded SiC-SiC interface
G. N. Yushin, A. V. Kvit, Z. SitarVolume:
40
Language:
english
Pages:
3
DOI:
10.1007/s10853-005-0779-4
Date:
August, 2005
File:
PDF, 368 KB
english, 2005