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Identification and characterization of diffusion barriers for Cu/SiC systems
Glenn Sundberg, Pradeep Paul, Changmo Sung, Thomas VasilosVolume:
40
Language:
english
Pages:
5
DOI:
10.1007/s10853-005-4583-y
Date:
September, 2005
File:
PDF, 502 KB
english, 2005