Electron microscope weak-beam imaging of stacking fault tetrahedra: observations and simulations
M. L. Jenkins, Z. Zhou, S. L. Dudarev, A. P. Sutton, M. A. KirkVolume:
41
Language:
english
Pages:
9
DOI:
10.1007/s10853-006-0089-5
Date:
July, 2006
File:
PDF, 525 KB
english, 2006