Nanosecond time resolved electron diffraction studies of...

Journal of Materials Science 2006 / 07 Vol. 41; Iss. 14

Nanosecond time resolved electron diffraction studies of the α→β in pure Ti thin films using the dynamic transmission electron microscope (DTEM)

Thomas LaGrange, Geoffrey H. Campbell, Jeffrey D. Colvin, Bryan Reed, Wayne E. King
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Volume:
41
Language:
english
Pages:
5
DOI:
10.1007/s10853-006-0090-z
Date:
July, 2006
File:
PDF, 422 KB
english, 2006
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