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The impact of electron beam damage on the detection of indium-rich localisation centres in InGaN quantum wells using transmission electron microscopy
T. M. Smeeton, C. J. Humphreys, J. S. Barnard, M. J. KappersVolume:
41
Language:
english
Pages:
9
DOI:
10.1007/s10853-006-7876-x
Date:
May, 2006
File:
PDF, 51.97 MB
english, 2006