X-Ray Diffraction Evaluation of the Average Number of...

Materials Science Forum 2019 / 6 Vol. 958

X-Ray Diffraction Evaluation of the Average Number of Layers in Thermal Reduced Graphene Powder for Supercapacitor Nanomaterial

Cardoso, Quezia de Aguiar, Casini, Julio César Serafim, Barbosa, Luzinete Pereira, Serna, Marilene Morelli, Galego, Eguiberto, Sobrinho, Luiza Ferreira, Sakata, Solange Kazumi, de Faria Jr., Rubens Nu
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Volume:
958
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.958.117
Date:
June, 2019
File:
PDF, 486 KB
2019
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