Sub-nm-Scale Depth Profiling of Nitrogen in NO- and...

Materials Science Forum 2019 / 7 Vol. 963

Sub-nm-Scale Depth Profiling of Nitrogen in NO- and N2-Annealed SiO2/4H-SiC(0001) Structures

Moges, Kidist, Sometani, Mitsuru, Hosoi, Takuji, Shimura, Takayoshi, Harada, Shinsuke, Watanabe, Heiji
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
963
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.963.226
Date:
July, 2019
File:
PDF, 995 KB
2019
Conversion to is in progress
Conversion to is failed