Deep Electronic Levels in n-Type and p-Type 3C-SiC

Materials Science Forum 2019 / 7 Vol. 963

Deep Electronic Levels in n-Type and p-Type 3C-SiC

Schöler, Michael, Lederer, Maximilian W., Wellmann, Peter J.
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Volume:
963
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.963.297
Date:
July, 2019
File:
PDF, 1.32 MB
2019
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