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Multi-Barrier Height Characterization and DLTS Study on Ti/W 4H-SiC Schottky Diode
Zhang, Teng, Raynaud, Christophe, Planson, DominiqueVolume:
963
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.963.576
Date:
July, 2019
File:
PDF, 479 KB
2019