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Comparison of SiC MOSFET Characteristics Following Body-Diode Forward-Current Stress
Green, Ronald, Lelis, Aivars, Nouketcha, FranklinVolume:
963
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.963.583
Date:
July, 2019
File:
PDF, 3.39 MB
2019