Phase transition characteristics and electrical properties of nitrogen-doped GeSb thin films for PRAM applications
Seung Yun Lee, Hyung Keun Kim, Jin Hyock Kim, Jae Sung Roh, Doo Jin ChoiVolume:
44
Language:
english
Pages:
6
DOI:
10.1007/s10853-009-3650-1
Date:
August, 2009
File:
PDF, 405 KB
english, 2009