Quantitative evaluation of high temperature deformation...

Journal of Materials Science 2010 / 10 Vol. 45; Iss. 20

Quantitative evaluation of high temperature deformation mechanisms: a specific microgrid extensometry technique coupled with EBSD analysis

A. Soula, D. Locq, D. Boivin, Y. Renollet, P. Caron, Y. Bréchet
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Volume:
45
Language:
english
Pages:
11
DOI:
10.1007/s10853-010-4630-1
Date:
October, 2010
File:
PDF, 1.27 MB
english, 2010
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