Optical characterisation of a-Si:H and nc-Si:H thin films...

Journal of Materials Science: Materials in Electronics 2007 / 10 Vol. 18; Iss. 1 Suppleme

Optical characterisation of a-Si:H and nc-Si:H thin films using the transmission spectrum alone

S. Halindintwali, D. Knoesen, T. F. G. Muller, D. Adams, N. Tile, C. C. Theron, R. E. I. Schropp
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Volume:
18
Language:
english
Pages:
5
DOI:
10.1007/s10854-007-9194-8
Date:
October, 2007
File:
PDF, 319 KB
english, 2007
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