![](/img/cover-not-exists.png)
Degradation of SiC-MESFETs by irradiation
H. Ohyama, K. Takakura, K. Uemura, K. Shigaki, T. Kudou, T. Matsumoto, M. Arai, S. Kuboyama, C. Kamezawa, E. Simoen, C. ClaeysVolume:
19
Language:
english
Pages:
4
DOI:
10.1007/s10854-007-9330-5
Date:
February, 2008
File:
PDF, 250 KB
english, 2008