Defect investigation and temperature analysis of high-power...

Journal of Materials Science: Materials in Electronics 2008 / 12 Vol. 19; Iss. 1 Suppleme

Defect investigation and temperature analysis of high-power AlGaInP laser diodes during catastrophic optical damage

Marwan Bou Sanayeh, Peter Brick, Wolfgang Schmid, Bernd Mayer, Martin Müller, Martin Reufer, Klaus Streubel, Sandy Schwirzke-Schaaf, Jens W. Tomm, Andreas Danilewsky, Gerd Bacher
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Volume:
19
Language:
english
Pages:
5
DOI:
10.1007/s10854-007-9478-z
Date:
December, 2008
File:
PDF, 361 KB
english, 2008
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