Correlation between the free carrier lifetime and total...

Journal of Materials Science: Materials in Electronics 2008 / 12 Vol. 19; Iss. 1 Suppleme

Correlation between the free carrier lifetime and total amount of deep centers in ZnO single crystals

Vladimir Gavryushin, Arunas Kadys, Ramunas Aleksiejunas, Kestutis Jarasiunas
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Volume:
19
Language:
english
Pages:
5
DOI:
10.1007/s10854-007-9490-3
Date:
December, 2008
File:
PDF, 502 KB
english, 2008
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