![](/img/cover-not-exists.png)
Numerical analysis of Double Gate and Gate All Around MOSFETs with bulk trap states
M. A. Abdi, F. Djeffal, D. Arar, M. L. HafianeVolume:
19
Language:
english
Pages:
6
DOI:
10.1007/s10854-007-9531-y
Date:
December, 2008
File:
PDF, 414 KB
english, 2008