Application of computational intelligence to analysis of...

Journal of Materials Science: Materials in Electronics 2008 / 12 Vol. 19; Iss. 1 Suppleme

Application of computational intelligence to analysis of PITS spectral images for defect centres in semi-insulating materials

Stanisław Jankowski, Pawel Kamiński, Janusz Będkowski, Zbigniew Szymański, Przemysław Danilewicz, Roman Kozłowski, Michał Pawłowski
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Volume:
19
Language:
english
Pages:
6
DOI:
10.1007/s10854-008-9637-x
Date:
December, 2008
File:
PDF, 299 KB
english, 2008
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