Dielectric properties, microstructure and diffuse...

Journal of Materials Science: Materials in Electronics 2010 / 08 Vol. 21; Iss. 8

Dielectric properties, microstructure and diffuse transition of Al-doped Ba(Zr0.2Ti0.8)O3ceramics

Wei Cai, Chunlin Fu, Jiacheng Gao, Xiaoling Deng
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Volume:
21
Language:
english
Pages:
8
DOI:
10.1007/s10854-009-9995-z
Date:
August, 2010
File:
PDF, 717 KB
english, 2010
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