Measurements of dielectric properties of TiO2thin films at...

Journal of Materials Science: Materials in Electronics 2010 / 08 Vol. 21; Iss. 8

Measurements of dielectric properties of TiO2thin films at microwave frequencies using an extended cavity perturbation technique

Jyh Sheen, Chueh-Yu Li, Liang-Wen Ji, Wei-Lung Mao, Weihsing Liu, Chin-An Chen
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Volume:
21
Language:
english
Pages:
5
DOI:
10.1007/s10854-009-9999-8
Date:
August, 2010
File:
PDF, 452 KB
english, 2010
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