Effects of trace amounts of rare earth additions on the...

Journal of Materials Science: Materials in Electronics 2012 / 01 Vol. 23; Iss. 1

Effects of trace amounts of rare earth additions on the microstructures and interfacial reactions of Sn57Bi1Ag/Cu solder joints

Cuiping Wu, Jun Shen, Changfei Peng
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Volume:
23
Language:
english
Pages:
8
DOI:
10.1007/s10854-011-0383-0
Date:
January, 2012
File:
PDF, 761 KB
english, 2012
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