Scanning electron microscopy and energy-dispersive X-ray...

Scanning electron microscopy and energy-dispersive X-ray analysis of self-etching adhesive systems to ground and unground enamel

Dinesh D. S. Weerasinghe, Toru Nikaido, Shizuko Ichinose, Kanchana G. P. Waidyasekara, Junji Tagami
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Volume:
18
Language:
english
Pages:
6
DOI:
10.1007/s10856-007-0149-7
Date:
June, 2007
File:
PDF, 329 KB
english, 2007
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