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The robust fail-safe topological designs based on the von Mises stress
Wang, Hongxin, Liu, Jie, Wen, Guilin, Xie, Yi MinVolume:
171
Journal:
Finite Elements in Analysis and Design
DOI:
10.1016/j.finel.2019.103376
Date:
April, 2020
File:
PDF, 3.98 MB
2020