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Hole-Induced Degradation in ${E}$ -Mode GaN MIS-FETs: Impact of Substrate Terminations
Hua, Mengyuan, Yang, Song, Wei, Jin, Zheng, Zheyang, He, Jiabei, Chen, Kevin J.Volume:
67
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2019.2954282
Date:
January, 2020
File:
PDF, 1.67 MB
2020