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Interfacial Impurities and Their Electronic Signatures in High‐Voltage Regrown Nonpolar m‐ Plane GaN Vertical p–n Diodes
Aragon, Andrew, Monavarian, Morteza, Stricklin, Isaac, Pickrell, Greg, Crawford, Mary, Allerman, Andrew, Armstrong, Andrew M., Feezell, DanielJournal:
physica status solidi (a)
DOI:
10.1002/pssa.201900757
Date:
December, 2019
File:
PDF, 3.64 MB
2019