Mapping Quantitative Trait Loci for Partial Resistance to...

Crop Science 2010 Vol. 50; Iss. 2

Mapping Quantitative Trait Loci for Partial Resistance to in a Soybean Interspecific Cross

Tucker, D. M., Saghai Maroof, M. A., Mideros, S., Skoneczka, J. A., Nabati, D. A., Buss, G. R., Hoeschele, I., Tyler, B.M., St. Martin, S. K., Dorrance, A. E.
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Volume:
50
Year:
2010
Journal:
Crop Science
DOI:
10.2135/cropsci2009.03.0161
File:
PDF, 1.01 MB
2010
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