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Effect of pulsed UV laser irradiation on 4H-SiC MOS with thermal gate oxide
Luo, Zhipeng, Wan, Caiping, Xu, Hengyu, Zhao, Fazhan, Jin, ZhiJournal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-019-02610-4
Date:
January, 2020
File:
PDF, 1.10 MB
2020