In situ observation of the solidification interface and...

In situ observation of the solidification interface and grain boundary development of two silicon seeds with simultaneous measurement of temperature profile and undercooling

Lau, Victor, Maeda, Kensaku, Fujiwara, Kozo, Lan, Chung-wen
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Volume:
532
Journal:
Journal of Crystal Growth
DOI:
10.1016/j.jcrysgro.2019.125428
Date:
February, 2020
File:
PDF, 1.17 MB
2020
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