![](/img/cover-not-exists.png)
[AIP Beam Instrumentation Workshop - Sante Fe, New Mexico (USA) (20−23 Oct 1993)] AIP Conference Proceedings - Noninvasive diagnostics for H− ion beams using photodetachment by a focused laser beam
Swenson, D. R., MacKerrow, E. P., Bryant, H. C.Volume:
319
Year:
1994
DOI:
10.1063/1.46991
File:
PDF, 908 KB
1994