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Direct observation of electronic structure change by resistance random access memory effect in amorphous alumina
Kubota, Masato, Nigo, Seisuke, Kato, Seiichi, Amemiya, KentaVolume:
9
Journal:
AIP Advances
DOI:
10.1063/1.5086212
Date:
September, 2019
File:
PDF, 1.04 MB
2019