[IEEE 2018 4th IEEE International Conference on Emerging Electronics (ICEE) - Bengaluru, India (2018.12.17-2018.12.19)] 2018 4th IEEE International Conference on Emerging Electronics (ICEE) - SEU Sensitivity of a 14-nm SOI FinFET eDRAM Cell under Heavy-ion Irradiation
Aditya, Kritika, Saini, Rohit, Kumar, Manoj, Singh, Ramendra, Dixit, AbhisekYear:
2018
DOI:
10.1109/ICEE44586.2018.8937969
File:
PDF, 313 KB
2018