[IEEE 2019 IEEE 8th Data Driven Control and Learning...

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[IEEE 2019 IEEE 8th Data Driven Control and Learning Systems Conference (DDCLS) - Dali, China (2019.5.24-2019.5.27)] 2019 IEEE 8th Data Driven Control and Learning Systems Conference (DDCLS) - Defect Detection of Yarn-dyed Shirts Based on Denoising Convolutional Self-encoder

Zhang, Hongwei, Tang, Wenbo, Zhang, Lingjie, Li, Pengfei, Gu, De
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Year:
2019
DOI:
10.1109/ddcls.2019.8908944
File:
PDF, 492 KB
2019
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