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NBTI and HCI Aging Prediction and Reliability Screening During Production Test
Yu, Liting, Ren, Jianguo, Lu, Xian, Wang, XiaoxiaoYear:
2019
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/tcad.2019.2961329
File:
PDF, 6.55 MB
2019