[IEEE 2019 20th International Conference on Solid-State Sensors, Actuators and Microsystems & Eurosensors XXXIII (TRANSDUCERS & EUROSENSORS XXXIII) - Berlin, Germany (2019.6.23-2019.6.27)] 2019 20th International Conference on Solid-State Sensors, Actuators and Microsystems & Eurosensors XXXIII (TRANSDUCERS & EUROSENSORS XXXIII) - MEMS Enabled Fast Time-Resolved X-Ray Diffraction Characterization Platform for Copper Nanoparticle Sintering in Heterogeneous Integration Applications
Zhang, Boyao, Wei, Jia, Bottger, Amarante J., van Zeijl, Henk W., Sarro, Pasqualina M., Zhang, GuoqiYear:
2019
DOI:
10.1109/transducers.2019.8808192
File:
PDF, 1.31 MB
2019