Anomalies in Measurement of Residual Stress by X-Ray...

Anomalies in Measurement of Residual Stress by X-Ray Diffraction

Marion, R. H., Cohen, J. B.
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Volume:
18
Year:
1974
Journal:
Advances in X-ray Analysis
DOI:
10.1154/S0376030800006960
File:
PDF, 1.35 MB
1974
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