EXPRESS: Quantitative Measurement of Fluorescent Layers with Respect to Spatial Thickness Variations and Substrate Properties
Holz, Philipp, Pönisch, Christoph, Brandenburg, AlbrechtJournal:
Applied Spectroscopy
DOI:
10.1177/0003702819885932
Date:
October, 2019
File:
PDF, 2.84 MB
2019