EXPRESS: Quantitative Measurement of Fluorescent Layers...

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EXPRESS: Quantitative Measurement of Fluorescent Layers with Respect to Spatial Thickness Variations and Substrate Properties

Holz, Philipp, Pönisch, Christoph, Brandenburg, Albrecht
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Journal:
Applied Spectroscopy
DOI:
10.1177/0003702819885932
Date:
October, 2019
File:
PDF, 2.84 MB
2019
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