Electrical Characterization of Silicon - Nickel Iron Oxide...

MRS Advances 2019 Vol. 4; Iss. 41-42

Electrical Characterization of Silicon - Nickel Iron Oxide Heterojunctions

Talbert, James N., Cantrell, Samuel R., Ahad Talukder, Md. Abdul, Scolfaro, Luisa M., Geerts, Wilhelmus J.
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Volume:
4
Year:
2019
Journal:
MRS Advances
DOI:
10.1557/adv.2019.321
File:
PDF, 639 KB
2019
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